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Physical Chemistry / Molecular Material ScienceAFM

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AFM  Rasterkraftmikroskop
AFM Rasterkraftmikroskop

Asylum Research MFP3D Colloidal Probe AFM:
Colloidal probe atomic force microscopy (colloidal probe AFM) offers the possibility to directly study forces between virtually all kinds of surfaces with resolution of few pN.
In colloidal probe AFM a micrometer-sized particle (the colloidal probe) is glued to the end of an AFM cantilever and is moved towards and retract from a flat surface with the use of a piezo scanner. The deflection of the cantilever is measured as a function of piezo position and reflects the forces acting between the surfaces.


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